Title:
TESTING DEVICE AND TESTING METHOD
Document Type and Number:
Japanese Patent JP2012002640
Kind Code:
A
Abstract:
To provide a testing device capable of recording desired log data indicating a device state and the like before/after triggering such as when abnormality occurs in a spot manner at a fine time interval, and a log data recording method for the same.
The testing device carrying out charge- or discharge testing for a sample includes first memory for sequentially overwriting oldest data with state information to execute loop recording if the state information acquired at given sampling time does not exceed a preset threshold value, and a second memory for sequentially recording state information if the state information exceeds a preset threshold value.
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Inventors:
TOCHI KIYOHISA
Application Number:
JP2010137253A
Publication Date:
January 05, 2012
Filing Date:
June 16, 2010
Export Citation:
Assignee:
FUJITSU TELECOM NETWORKS LTD
International Classes:
G01D9/00; G01D9/18; G01D9/32; G01R31/36
Domestic Patent References:
JPS62212848A | 1987-09-18 | |||
JPH06148297A | 1994-05-27 | |||
JPH08247799A | 1996-09-27 |
Attorney, Agent or Firm:
Kazuhiro Kamata
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