To change setting of pin arrangement in a test of a plurality of devices to be tested having the same pin arrangement.

This device is equipped with a control device for controlling the test of the plurality of testing object devices having the same pin arrangement, and a plurality of pin resources provided respectively corresponding to each terminal of the testing object devices. Each pin resource has a test signal supply part for supplying a test signal to a terminal to be connected, a plurality of pin allocation resisters for storing each pin number of the devices to be tested, a selection resister for storing selection information for showing which pin allocation resister is to be selected, a selection part for selecting the pin number stored in the pin allocation resister designated by the selection information, a detection part for detecting whether the pin number designated by a write command agrees with the selected pin number or not when the control device issues the write command to the test signal supply part, and a writing part for writing write data designated by the write command on condition that the pin numbers agree with each other into the test signal supply part.