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Title:
TESTING METHOD FOR HYBRID INTEGRATED CIRCUIT
Document Type and Number:
Japanese Patent JPS57149973
Kind Code:
A
Abstract:

PURPOSE: To replace defective parts of a hybrid integrated circuit before a metallic case is bonded, by performing the burn-in operation of the hybrid integrated circuit in protective box wherein inert gas is sealed, and extracting defection in an early stage.

CONSTITUTION: On the center projecting part 10' of a protective box body 10, the metallic stem 1 of a hybrid integrated circuit is held. This body 10 is provided with a suction pipe 15 and a suction pipe 16 and in the protective box wherein inert gas is sealed, the hybrid integrated circuit is burned in through an airtight terminal 14, a connector 13, etc. to test its characteristics, thus extracting defective in an early stage. Therefore, before a metallic case 4 is bonded, parts such as defective active element 3 are replaced, generating the hybrid integrated circuit efficiently.


Inventors:
YABE NORIO
TAKAHARA TOSHIO
Application Number:
JP3505681A
Publication Date:
September 16, 1982
Filing Date:
March 11, 1981
Export Citation:
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Assignee:
FUJITSU LTD
International Classes:
G01R31/28; G01R31/30; G01R31/26; (IPC1-7): G01R31/26



 
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