Title:
THICKNESS MEASUREMENT DEVICE
Document Type and Number:
Japanese Patent JP2017223554
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To suppress deviation of a position at which a thickness is detected.SOLUTION: A measurement device of one embodiment comprises a radiation source, a detection unit, a digital conversion unit, an interface, a control unit, and a conversion unit. The radiation source radiates a radiant ray to a measurement object. The detection unit detects, via the measurement object, the radiant ray having passed through the measurement object. The digital conversion unit converts a detection signal in which an attenuated amount of the radiant ray having passed through the measurement object is indicated by an analog value into a digital value. The interface allows a pulse signal generated from a pulse generator provided in a drive unit for changing a physical relationship between the measurement object and a bogie on which the detection unit is mounted to be input. The control unit associates the detection signal converted into the digital value by the digital conversion unit and the pulse signal inputted from the interface with each other and outputs them. The conversion unit converts the detection signal inputted from the control unit into a thickness of the measurement object, and converts the pulse signal into positional information that indicates the physical relationship between the measurement object and the detection unit.SELECTED DRAWING: Figure 1
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Inventors:
YONEKAWA SAKAE
Application Number:
JP2016119221A
Publication Date:
December 21, 2017
Filing Date:
June 15, 2016
Export Citation:
Assignee:
TOSHIBA CORP
TOSHIBA INFRASTRUCTURE SYSTEMS & SOLUTIONS CORP
TOSHIBA INFRASTRUCTURE SYSTEMS & SOLUTIONS CORP
International Classes:
G01B15/02
Attorney, Agent or Firm:
Sakai International Patent Office
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