Title:
THICKNESS MEASUREMENT METHOD AND DEVICE FOR CYLINDRICAL MATERIAL
Document Type and Number:
Japanese Patent JPH04188009
Kind Code:
A
Abstract:
PURPOSE:To precisely measure the thickness of a ceramic-made long cylindrical material by fixing laser sensors on the edge parts of two long rodlike measurement arms to use respectively. CONSTITUTION:A first laser sensor 12 is arranged on a vertical line through a center axis 35 of a material 34 to be measured while a second laser sensor 14 is set on the same vertical line of the material 34 to be measured. A measurement point 37 of the inner circumferential face of the material 34 to be measured is detected by a first laser sensor 12 and the distance l1 between the first laser sensor 12 and the measurement point 37 of the inner circumferential face is measured while a measurement point 38 of the outer peripheral face of the material 34 to be measured is detected by the second laser sensor 14 to measure the other distance between the second laser sensor 14 and the measurement point 38 of the outer peripheral face. The thickness (t) of the material 34 to be measured is calculated by subtracting said measurement values l1, l2 from the absolute distance L between the first and the second laser sensors previously measured.
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Inventors:
NUMATA KOICHI
YAMADA TORU
HAYASHI NORIO
YAMADA TORU
HAYASHI NORIO
Application Number:
JP31832890A
Publication Date:
July 06, 1992
Filing Date:
November 22, 1990
Export Citation:
Assignee:
SHINETSU CHEMICAL CO
International Classes:
G01B11/06; (IPC1-7): G01B11/06
Attorney, Agent or Firm:
Takashi Kojima