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Title:
THREE-CRYSTAL X RAY DIFFRACTION APPARATUS
Document Type and Number:
Japanese Patent JPS61202149
Kind Code:
A
Abstract:

PURPOSE: To improve the flatness of X rays in a 2-D region, by setting spectroscopic crystals on two goniometer heads having rotating shafts perpendicular to each other respectively, and a sample crystal on a goniometer head having a parallel rotating shaft with the second crystal.

CONSTITUTION: An incident X ray 11 is made incident into a spectroscopic crystal 13 set on a goniometer head (GH) rotating about the (y) axis 12 and a diffraction X ray 14 emitted from the crystal 13 is improved in the flatness in the direction (x) while in the direction (y) with a spectroscopic crystal 15 set on a GH rotating about the axis Z. X rays 17 with improved flatness in the 2-D area is incident into a sample crystal 19 set on a GH having a rotating shaft parallel with the crystal 15. The diffracted light 110 thereof is photographed with a nuclear dry plate 111.


Inventors:
KITANO TOMOHISA
Application Number:
JP4307885A
Publication Date:
September 06, 1986
Filing Date:
March 05, 1985
Export Citation:
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Assignee:
NEC CORP
International Classes:
G01N23/20; G01N23/205; (IPC1-7): G01N23/20
Attorney, Agent or Firm:
Uchihara Shin



 
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