Title:
THREE-DIMENSIONAL MEASUREMENT METHOD, THREE-DIMENSIONAL MEASUREMENT DEVICE, AND ROBOT SYSTEM
Document Type and Number:
Japanese Patent JP2020159732
Kind Code:
A
Abstract:
To provide a three-dimensional measurement method, a three-dimensional measurement device and a robot system with which it is possible to three-dimensionally measure an object quickly with good accuracy.SOLUTION: The three-dimensional measurement method three-dimensionally measures an object by projecting pattern light formed by a laser beam scanned by a light scan unit to the object and imaging the object projected with the pattern light by an imaging unit. When oscillation in a first direction of rotation around the oscillation axis of a mirror is defined as an outward path and oscillation in a direction opposite the first rotation direction is defined as an inward path, the outward path pattern light formed by emitting a laser beam in the outward path and the inward path pattern light formed by emitting a laser beam in the inward path match each other.SELECTED DRAWING: Figure 2
Inventors:
KAMAKURA KEI
WAKABAYASHI SHUICHI
SHIMIZU TAKESHI
WAKABAYASHI SHUICHI
SHIMIZU TAKESHI
Application Number:
JP2019056580A
Publication Date:
October 01, 2020
Filing Date:
March 25, 2019
Export Citation:
Assignee:
SEIKO EPSON CORP
International Classes:
G01B11/25; B25J13/08; G02B26/10
Attorney, Agent or Firm:
Tatsuya Masuda
Kazuo Asahi
Kazuo Asahi