Title:
三波横方向せん断型のコンパクト色消し光学干渉計
Document Type and Number:
Japanese Patent JP4862051
Kind Code:
B2
Abstract:
A method and a system for analyzing the wavefront of a light beam, wherein a diffraction grating is arranged in a plane perpendicular to the light beam to be analyzed and optically conjugated to the analysis plane. Different emerging beams of the grating interfere to generate an image having deformations linked to the gradients of the wavefront to be analyzed. The method is characterized in that the grating carries out the multiplication of an intensity function which is implemented by a two-dimensional grating with hexagonal meshing of surface S transmitting the light of the beam to be analyzed into plural emerging beams arranged in a hexagonal meshing, by an phase function which is implemented by a two-dimensional grating with hexagonal meshing of surface 3S which introduces a phase shift close to 2π/3 (modulo 2π) between two adjacent secondary beams.
Inventors:
Primo, Jerome
Guerinoe, Nikola
Verge, Sabrina
Guerinoe, Nikola
Verge, Sabrina
Application Number:
JP2008550818A
Publication Date:
January 25, 2012
Filing Date:
January 16, 2007
Export Citation:
Assignee:
Onuerua (Office National Des Etudes Le Cherus Aerospacial)
International Classes:
G01M11/00; G01N21/41
Domestic Patent References:
| JP2001050819A | 2001-02-23 | |||
| JPH07198352A | 1995-08-01 |
Attorney, Agent or Firm:
Shigeru Inaba