Title:
THRESHOLD VOLTAGE MEASUREMENT METHOD FOR ELECTRONIC CIRCUIT HAVING HYSTERISIS CHARACTERISTIC
Document Type and Number:
Japanese Patent JP3260108
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To provide a threshold voltage measurement method capable of efficiently measuring the threshold voltage of an electronic circuit having hysterisis characteristics.
SOLUTION: In this threshold voltage measurement method for measuring, by a bisecting method, the upper limit threshold voltage and lower limit threshold voltage of the electronic circuit having the upper limit threshold voltage V+ (2.6 V), in which the output voltage changes on the way that the input voltage of the electronic circuit changes from a small value to a large value and the lower limit threshold voltage V- (2.3 V) in which the output voltage changes on the way that the input voltage of the electronic circuit changes from the large value to the small value and having the hysterisis characteristics between the change of the input voltage and the change of the output voltage, measurement of V+ is performed when the output voltage is changed in the measurement of V-, the measurement of V- is performed when the output voltage is changed in the measurement of V+ and the input voltage is returned to a start voltage only at the time of change the measurement. Thus, the number of steps of the measurement is substantially reduced.
Inventors:
Junichi Takeda
Kiyoto Shirai
Kiyoto Shirai
Application Number:
JP23345097A
Publication Date:
February 25, 2002
Filing Date:
August 29, 1997
Export Citation:
Assignee:
Aoi Electronics Co., Ltd.
International Classes:
G01R19/165; G01R31/317; G01R31/319; (IPC1-7): G01R31/317; G01R19/165; G01R31/319
Domestic Patent References:
| JP5178369A | ||||
| JP63138281A | ||||
| JP9218250A |
Attorney, Agent or Firm:
Takashi Shibuya