Title:
時間差測定装置および距離測定装置並びに距離測定方法
Document Type and Number:
Japanese Patent JP4878127
Kind Code:
B2
Abstract:
In measuring a certain time lag between generations of two pulse signals, a time lag measuring device prevents errors in measurement results even with an error in two reference signals for measuring the time lag. The device measures a time lag between a start signal M1 and a stop signal M2 and includes a reference signal generating section 41 generating two reference signals S1, S2 having a phase difference À /2 , and an amplitude detecting section 42 detects amplitudes A11, A12 and A21, A22 of the reference signals S1, S2 at generation timings for the start signal M1 and the stop signal M2, a phase difference detecting section 43 calculating a phase ¸ of the reference signals S according to each set of the amplitudes (A11, A12) and (A21, A22), and a correcting section 46 correcting the calculated phase using correction data for error correction in the reference signals S1, S2.
Inventors:
Masahiro Oishi
Yoshikatsu Tokuda
Fumio Otomo
Yoshikatsu Tokuda
Fumio Otomo
Application Number:
JP2005171571A
Publication Date:
February 15, 2012
Filing Date:
June 10, 2005
Export Citation:
Assignee:
Topcon Co., Ltd.
International Classes:
G01S17/10; G01S7/4865; G04F10/06
Domestic Patent References:
| JP8122465A | ||||
| JP62063885A | ||||
| JP5231879A | ||||
| JP63085489A | ||||
| JP2077673A | ||||
| JP2006133214A | ||||
| JP2005024398A | ||||
| JP2004219333A | ||||
| JP2003185747A | ||||
| JP58174874A |
Foreign References:
| US5566139 | ||||
| US5218289 |
Attorney, Agent or Firm:
Tamio Nishiwaki