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Patent Searching and Data


Title:
飛行時間型質量分析方法及び装置
Document Type and Number:
Japanese Patent JP5226824
Kind Code:
B2
Abstract:

To provide a time-of-flight mass spectrometry apparatus in which convergence of ions in vertical direction is improved, and connection to an orthogonally accelerating ion source is achieved for improving sensitivity.

The time-of-flight mass spectrometry apparatus includes: an ion source 10 to emit a plurality of ions in pulse; an analyzer to achieve the spiral orbit; and a detector 15 to detect the ions. For achieving the spiral orbit, the analyzer is constituted of a plurality of laminated toroidal electric fields.

COPYRIGHT: (C)2011,JPO&INPIT


Inventors:
Takaya Sato
Satoshi Toyoda
Morio Ishihara
Application Number:
JP2011086863A
Publication Date:
July 03, 2013
Filing Date:
April 09, 2011
Export Citation:
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Assignee:
JEOL Ltd.
International Classes:
H01J49/40; G01N27/62; G01N27/64; H01J49/06; H01J49/10
Domestic Patent References:
JP2000243345A
JP11135061A
JP2003086129A
JP2001028253A
Other References:
Daisuke OKUYAMA et al,A compact sector-type multi-turn time-of flight mass spectrometer 'MULTIM II',Nuclear Instruments & Methods in Physics Research Section A,,2004年 2月21日,519(1/2),21,p.331-337