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Patent Searching and Data


Title:
TIME SERIES DATA WAVEFORM ANALYZER, METHOD, AND PROGRAM
Document Type and Number:
Japanese Patent JP2017138929
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide a time series data waveform analyzer in which a calculation amount is reduced, and a method and a program.SOLUTION: A time series data waveform analyzer related to one embodiment, comprises a feature waveform addition section, a feature quantity calculation section, a parameter update section, and a feature waveform removal section. The feature waveform addition section adds a part of partial time series included in time series data with labels as a feature waveform to a feature waveform aggregate. The feature quantity calculation section extracts the time series data with one or a plurality of labels at random, and calculates feature quantity of the feature waveform with respect to the time series data with the labels extracted on the basis of a TSS method. The parameter update section updates a parameter including the feature waveform and a weighting factor corresponding to the feature waveform based on a stochastic gradient descent method, on the basis of the feature quantity. The feature waveform removal section removes the feature waveform having a corresponding weighting factor of 0 from the feature waveform aggregate. The evaluation function generation section generates an evaluation function based on the feature waveform and the weighting factor.SELECTED DRAWING: Figure 1

Inventors:
SUEHIRO DAIKI
OGUSHI TOSHIAKI
Application Number:
JP2016021313A
Publication Date:
August 10, 2017
Filing Date:
February 05, 2016
Export Citation:
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Assignee:
TOSHIBA CORP
International Classes:
G06F17/30; G06N99/00
Attorney, Agent or Firm:
Hiroyuki Nagai
Yukitaka Nakamura
Yasukazu Sato
Satoru Asakura
Takeshi Sekine
Suzuki Junsei