Title:
タイヤ均等性試験装置
Document Type and Number:
Japanese Patent JP4875189
Kind Code:
B2
Abstract:
A tire uniformity testing system includes a testing station mounted on a gantry-like frame structure and an inlet conveyor located adjacent to the testing station. The inlet conveyor receives a tire and centers the tire such that its rotational axis is located at predetermined distance from the rotational axis of the testing station, and a conveyor transports the tire to the testing station. The testing station includes rotatable chuck assembly for engaging and rotating a tire which in turn is engaged by a loadwheel that generates tire uniformity data. The inlet conveyor is mechanically isolated from the testing station. The frame forming part of the testing station includes a plurality of I-beams joined together in flange abutting relationship which, in addition to producing a mechanically rigid structure, provides spaces defined between the flanges of the beams that are suitable for routing electrical wiring, pneumatic or hydraulic lines, etc. The tire uniformity machine has a width dimension that is at least 10% greater than a depth dimension and this feature coupled with an integral crane increases the accessibility and serviceability of components in the machine. A probe system is positioned between two adjacent vertical I-beams so that the bulk of the mechanism is protected and only distal ends of the probe extend into the testing region. The probes themselves include magnetic breakaway couplings which allow sensors to decouple from the ends of the probe should contact occur between a probe and a tire being tested.
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Inventors:
Reynolds, Dennis Allin
Beaumet, Francis Jay.
Richard, Richard
Jerryson, Frank Earl.
Leeds, David W., Senior
Naifard, Keith A.
Quinn, Christie
Beaumet, Francis Jay.
Richard, Richard
Jerryson, Frank Earl.
Leeds, David W., Senior
Naifard, Keith A.
Quinn, Christie
Application Number:
JP2010141373A
Publication Date:
February 15, 2012
Filing Date:
June 22, 2010
Export Citation:
Assignee:
Micro-Poise Measurement Systems, Limited Liability Company
International Classes:
G01M17/02; B60C19/00; B60C25/00; B60C25/132
Domestic Patent References:
| JP1155234A | ||||
| JP48015981A | ||||
| JP51097101A | ||||
| JP51041586A | ||||
| JP3086530A |
Foreign References:
| US5027649 | ||||
| US4023407 |
Attorney, Agent or Firm:
Atsushi Aoki
Tetsuro Shimada
Shinji Mitsuhashi
Hirose Shigeki
Kazuo Maejima
Tetsuro Shimada
Shinji Mitsuhashi
Hirose Shigeki
Kazuo Maejima