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Patent Searching and Data


Title:
ULTRASONIC EXAMINATION DEVICE
Document Type and Number:
Japanese Patent JPS6014168
Kind Code:
A
Abstract:

PURPOSE: To correct a variance of transmitting circuits or the like by providing an input selecting circuit between each ultrasonic vibrator and each receiving circuit and switching the output of the transmitting circuit and the receiving signal from a material to be examined to input them to the receiving circuit.

CONSTITUTION: In the ultrasonic examination device consisting of an ultrasonic probe 1, transmitting circuits 2aW2n, transmission delay circuits 3aW3n, receiving circuits 4aW4n, reception delay circuits 5aW5n, a delay time control circuit 6, an adding circuit 8, a reception level detecting circuit 12, a discriminating circuit 13, etc., input selecting circuits 20aW20n are provided between ultrasonic vibrators 1aW1n constituting the ultrasonic probe 1 and receiving circuits 4aW4n respectively. Input selecting circuits 20aW20n switch outputs of transmitting circuits 2aW2n and the receiving signal from the material to be examined and output them to receiving circuits 4aW4n. Variances of sensitivity of transmission delay circuits, transmitting circuits, transmission cables, and vibrators are corrected for individual vibrators.


Inventors:
SUGINO KAZUMI
ICHIKAWA HIROSHI
Application Number:
JP12260683A
Publication Date:
January 24, 1985
Filing Date:
July 06, 1983
Export Citation:
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Assignee:
MITSUBISHI ELECTRIC CORP
International Classes:
A61B8/00; A61B8/14; G01N29/30; (IPC1-7): G01N29/06; A61B8/14
Attorney, Agent or Firm:
Masuo Oiwa