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Patent Searching and Data


Title:
EXAFS MEASURING INSTRUMENT
Document Type and Number:
Japanese Patent JPH0666738
Kind Code:
A
Abstract:

PURPOSE: To obtain an extended X-ray absorption fine structure (EXAFS) measuring instrument which can use liquid samples as objects to be measured.

CONSTITUTION: The instrument is constituted in such a way that X-rays of different energy are taken out by changing the incident angle θ of X rays R1 made incident to a monochromator 10 from an X-ray source F while the source F, monochromator 10, and a light receiving slit 17 are always positioned on a Rowland circle L1 and the X rays are projected upon a sample 27. The circle L1 is set so that the circuit L1 can be included in a vertical plane and the sample 27 is supported by means of a cylindrical sample holder 53. In addition, the holder 53 is maintained so that the holder 53 can be parallel-displaced by means of a horizontal sample holding mechanism 62 without being tilted.


Inventors:
KIKU ATSUNORI
Application Number:
JP24424992A
Publication Date:
March 11, 1994
Filing Date:
August 20, 1992
Export Citation:
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Assignee:
RIGAKU DENKI CO LTD
International Classes:
G01N23/06; (IPC1-7): G01N23/06
Attorney, Agent or Firm:
Kuniaki Yokokawa