Title:
【発明の名称】コーティング厚さ測定計器
Document Type and Number:
Japanese Patent JP3092722
Kind Code:
B2
Abstract:
A coating thickness gauge includes a measurement transducer and a particularly advantageous probe arrangement. The probe arrangement includes a probe assembly and a probe housing that encircles the probe assembly. The probe assembly may include an inductor that forms a part of an LC oscillator. The gauge is able to measure the thickness of coatings on magnetic and non-magnetic substrates through use of the same probe assembly. Alternatively, the probe assembly can include a capacitor forming a part of an LC or an RC oscillator. The bottom surface of the probe housing has two oppositely positioned V-shaped grooves formed therein for facilitating the measurement of coating thicknesses on convex surfaces. The outer peripheral surface of the probe housing includes two spaced apart flat surfaces connected together by two arcuate surfaces for stabilizing the gauge during measurement of coating thicknesses on concave surfaces. The probe assembly is mounted within the gauge housing in a manner that is adapted to facilitate movement of the probe assembly in a substantially vertical plane. All functions of the gauge can be operated through the use of the two keys and the gauge only requires a zeroing adjustment rather than a several step calibration procedure.
Inventors:
Rashid Kay. Aidan
Frank Jay Koch
Frank Jay Koch
Application Number:
JP13011791A
Publication Date:
September 25, 2000
Filing Date:
June 01, 1991
Export Citation:
Assignee:
Defelsco Corporation
International Classes:
G01B5/00; G01B7/06; G01B7/00; G01R27/00; G01R27/26; (IPC1-7): G01B7/06; G01B7/00
Domestic Patent References:
| JP6021401A | ||||
| JP5575608A | ||||
| JP6321501A | ||||
| JP60138402A | ||||
| JP57144059A | ||||
| JP61190805U | ||||
| JP3935716Y1 |
Attorney, Agent or Firm:
Aoki Akira (4 outside)