Title:
【発明の名称】ICテスタ
Document Type and Number:
Japanese Patent JP3082900
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To provide an IC tester which is high in the degree of freedom and effective by providing a plurality of adders and multiplier to carry out various modulation on one modulation data. SOLUTION: Modulation data are changed over and given to the first and the second adder 1, 3 or a multiplier 6 for enlarging the degree of freedom. Namely, data composed of frequency data and modulation data which are added by the first adder 1 are inputted, and a phase accumulator 2 outputs phase data. The phase data sent from the phase accumulator and the modulation data are added by the second adder 3, and a sine wave table memory 4 outputs amplitude data with added data used as address. The amplitude data sent from the sine wave table memory 4 and the modulation data are mutually multiplayed by a multiplier 6, and a D/A converted signal is given to a tested object 9.
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Inventors:
Masahiro Ishibashi
Kenichi Narukawa
Hiroyuki Moriyama
Kenichi Narukawa
Hiroyuki Moriyama
Application Number:
JP28727695A
Publication Date:
August 28, 2000
Filing Date:
November 06, 1995
Export Citation:
Assignee:
Yokogawa Electric Corporation
International Classes:
G01R31/316; G01R31/3183; G06F1/02; H03B28/00; H03C1/00; H03C3/00; G01R31/28; (IPC1-7): G01R31/3183; G01R31/316; G06F1/02; H03B28/00; H03C1/00; H03C3/00
Domestic Patent References:
| JP192821A | ||||
| JP6474820A |