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Title:
SCREENING METHOD FOR ELECTRONIC COMPONENT
Document Type and Number:
Japanese Patent JPH0636976
Kind Code:
A
Abstract:

PURPOSE: To reduce defective articles caused by thermal stress and improve after-curing of mold resin, by performing aging after electronic components are subjected to first heat treatment, and again performing second heat treatment.

CONSTITUTION: Fluorine based inert liquid 1 is put in a heat-treating vessel 2, and heated at about 250-300°C with a heater 3. Electronic components are arranged in the liquid 1 or the vapor phase 4, and are subjected to first heat treatment. Next the electronic components 6 are subjected to aging under specified conditions, and again subjected to second heat treatment at a temperature nearly equal to the first treatment temperature. The process time T2 is about 5-600 seconds, and the relation to the first processing time T1 is T1<T2. After the second heat treatment, characteristics of the electronic components 6 are measured, and the electronic components in which deterioration of characteristics is generated are eliminated. Thereby electronic components excellent in heat resistance can be obtained with high yield.


Inventors:
YAMAMOTO ATSUSHI
SUZUKI NORIAKI
TAKAKU YUUYA
NISHIJIMA YASUYO
KURIHARA KANAME
Application Number:
JP21223692A
Publication Date:
February 10, 1994
Filing Date:
July 16, 1992
Export Citation:
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Assignee:
ELNA CO LTD
International Classes:
H01G9/04; H01G13/00; (IPC1-7): H01G13/00; H01G9/04
Domestic Patent References:
JPS63166210A1988-07-09
JPH0411716A1992-01-16
JPH01261812A1989-10-18
Attorney, Agent or Firm:
Takuya Ohara