Title:
【発明の名称】非接触倣い方法
Document Type and Number:
Japanese Patent JP2542653
Kind Code:
B2
Abstract:
Non-contact profiling is made by tilting the optical axis of a distance measuring probe (PB) capable of measuring optically and non-contactingly by an angle theta from a perpendicular axis and when the distance cannot be measured as the probe reaches a distance measurement disabling point (P1), the movement of the probe (PB) is stopped and the probe is rotated so as to tilt the optical axis by theta in the opposite direction from the vertical direction. Thereafter non-contact profiling is started once again. Whenever the probe reaches the distance measurement disabling point (P2, P3), non-contact profiling is continued by letting the probe (PB) perform the same operation.
Inventors:
Hitoshi Matsuura
Application Number:
JP31291387A
Publication Date:
October 09, 1996
Filing Date:
December 10, 1987
Export Citation:
Assignee:
FANUC Corporation
International Classes:
B23Q35/128; G01B11/24; (IPC1-7): B23Q35/128; G01B11/24
Attorney, Agent or Firm:
Chika Saito