Title:
【発明の名称】光学的パターン認識分類装置
Document Type and Number:
Japanese Patent JP3325934
Kind Code:
B2
Abstract:
PURPOSE:To correctly recognize and classify patterns in spite of generation of a defect in the patterns and to enable the identification of the presence or absence of the defect and the specification of a defect place. CONSTITUTION:This optical pattern recognizing and classifying device is constituted of an optical correlation computing unit 1 which extracts characteristic quantities by using an optical system making the correlation of the inputted patterns or the computation analogous therewith and an identifying and discriminating device 22 which discriminates the input patterns in accordance with >=1 extracted characteristic quantities. The pattern desired to be recognized and classified is divided to plural partial patterns in a specific position in a pattern dividing device 18 and arbitrary one among these patterns is decided as the input pattern which is subjected to the discrimination in accordance with the characteristic quantity acquired by each of the divided patterns. The pattern to be examined is discriminated according to whether the specified number or above of the results of the discrimination coincide or not.
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Inventors:
Kazuhiro Ajimura
Nobuo Tomita
Nobuo Tomita
Application Number:
JP31999192A
Publication Date:
September 17, 2002
Filing Date:
November 30, 1992
Export Citation:
Assignee:
Sumitomo Osaka Cement Co., Ltd.
International Classes:
G02F3/00; G06E3/00; G06F15/18; G06N99/00; G06T7/00; (IPC1-7): G02F3/00; G06F15/18; G06T7/00
Domestic Patent References:
| JP57204979A |
Other References:
【文献】武居利治 他,31p-A-15 光学的相互相関とファジー的AND演算を用いたパターン認識方法,1991年春季第38回応用物理学関係連合講演会予稿集,第3分冊,pp.865
Attorney, Agent or Firm:
Yutaka Kuramochi