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Patent Searching and Data


Title:
LOGIC PROBE
Document Type and Number:
Japanese Patent JPS5822965
Kind Code:
A
Abstract:

PURPOSE: To inspect logic of a signal, by providing a function for inspecting a signal level of a digital circuit, and also supplying an inspecting signal of a high level and a low level, or an inspecting signal of prescribed pulse width, by switching a switch.

CONSTITUTION: As for a double-throw slide switch 9, contacts H0, H1 or L0, L1 are selected by sliding an operation part 9a. To the contact H0, supply voltage +V of a probe is applied through a resistance R2, and the contact L0 is grounded by a wide opening clip 4. To the contacts H1, L1, an inspecting signal Ph of prescribed pulse width of a monostable multivibrator 11, and an inverted inspecting signal Pl are selected. As for a double-throw slide switch 10, one of inspecting signals Sh, Sl is selected in the level side, and is supplied to a signal terminal 14 of a hook system through a self-return type normal open switch 12. Also, the multivibrator 11 is triggered. Also, in the pulse side, the signals Ph, Pl are selected. A logic detecting circuit 15 is capable of detecting logic of a signal of a place to which a probe 5 has contacted, and displaying 16 it.


Inventors:
KUMASAKA HIDEYUKI
SUZUKI TOSHIHARU
Application Number:
JP12179281A
Publication Date:
February 10, 1983
Filing Date:
August 05, 1981
Export Citation:
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Assignee:
NISSAN MOTOR
International Classes:
G01R19/165; (IPC1-7): G01R19/165
Attorney, Agent or Firm:
Kei Osawa