Title:
【発明の名称】分光測定の分離特性改良方法及び装置
Document Type and Number:
Japanese Patent JPS63500267
Kind Code:
A
Abstract:
PCT No. PCT/EP86/00395 Sec. 371 Date Feb. 27, 1987 Sec. 102(e) Date Feb. 27, 1987 PCT Filed Jul. 4, 1986 PCT Pub. No. WO87/00273 PCT Pub. Date Jan. 15, 1987.In spectrographic measurements, the selectivity (that is to say, the ratio of the signal from the analytical sample to the signal from the impurity) is of vital importance. If a narrow spectral band is filtered from the region of the spectrum to be examined by means of a filter arrangement or the like and supplied to a detector whose output signal is displayed, there is a substantial improvement in selectivity in that the filter apparatus is periodically displaced relative to the region of the spectrum to be examined, that the spectral band extending through the filter apparatus is periodically displaced over the range of the spectrum to be examined and that the output signal for the detector is transmitted to the display through a lock-in-amplifier whose phase-reference signal is proportional to the displacement.
Inventors:
Camancal
Application Number:
JP50386486A
Publication Date:
January 28, 1988
Filing Date:
July 04, 1986
Export Citation:
Assignee:
Camancal
International Classes:
G01J3/12; G01J3/02; G01J3/42; G01J3/433; G01N21/31; H01J49/02; (IPC1-7): G01J3/12
Domestic Patent References:
| JPS5210186A | 1977-01-26 | |||
| JPS55149023A | 1980-11-20 | |||
| JPS5492790A | 1979-07-23 | |||
| JPS56119821A | 1981-09-19 |
Foreign References:
| US3740144A | 1973-06-19 | |||
| US4521687A | 1985-06-04 |
Attorney, Agent or Firm:
Nobujun Kobashi