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Patent Searching and Data


Title:
APPARATUS FOR MEASURING ECCENTRIC AMOUNT
Document Type and Number:
Japanese Patent JPS5938632
Kind Code:
A
Abstract:

PURPOSE: To enhance the measuring preciseness of the titled apparatus, by constituting the same from such a mechanism that the image forming position of the image of an object formed by an image forming means can be shifted from a reference axis by a shift amount corresponding to the eccentric amount of a lens to be measured.

CONSTITUTION: Light LP1 passing a lens to be measured is passed through a light path length changeable means consisting of a condensing lens 11, a mirror apparatus 12 and a corner cube 13, a lens 14 to be tested, a corner cube 16 and a focusing lens 17 and reflected by a motor 18 to be made incident to a half mirror 20. On the other hand, reference axis set light LP2 separated by a half mirror 10 is reflected by a mirror 19 to be made incident to the half mirror 20 and superposed to the light LP2' to be formed on an image surface PG by an image forming system 21. The light LP1' has angle difference with respect to the reference axis set light LP2 and image shift is generated to respective images due to the reference axis set light LP2 and the light LP1 by said angle difference. An eccentric amount and a falling amount are calculated from data obtained by measuring said shift amount.


Inventors:
AZUMI TAKASHI
MARUYAMA TAKESUKE
HISADA TAKAKI
SATOU HIRONOBU
Application Number:
JP14761082A
Publication Date:
March 02, 1984
Filing Date:
August 27, 1982
Export Citation:
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Assignee:
HITACHI LTD
International Classes:
G01M11/00; G01M11/02; (IPC1-7): G01M11/00
Attorney, Agent or Firm:
Toshiyuki Usuda