PURPOSE: To obtain a solid-state image-pickup device with which a measurement of absolute temperature can be performed easily by a method wherein two or more kinds of narrow band-pass filters, having different transmissive wavelength regions on the infrared ray incidence surface of a photoelectric conversion part, are provided.
CONSTITUTION: Infrared rays are made to incident from a metal side electrode of Schottky junction. Filters 13, 14 and 15 are narrow band-pass filters having different band-passes respectively. As generally known, the filters are formed into mosaic form or stripe form using a dielectric multilayer film by performing a sputtering method, a vapordeposition method and the like. The signal charge obtained by performing a photoelectric conversion is conveyed to a vertical shift resistor 1 through a transfer transistor 3, it is transferred in the lower direction inside a vertical shift resistor 1, a signal charge is moved to a horizontal shift resistor 4, it is transferred in the left direction inside the horizontal shift resistor 4, and the electric charge is read out from an output part 5. Pertaining to photoelectric conversion, the absolute temperature and the emissive power of a substance are obtained from the signal of the three adjoining photoelectric conversion parts 2-1, 2-2 and 2-3, using the formula of the signal charge of the infrared rays passed through the filters 13, 14 and 15.
WO/2005/084327 | SPECTROSCOPY IMAGER METHODS AND APPARATUS HAVING EXTENDED DYNAMIC RANGE |
JP2007329851 | DIGITAL CAMERA |
JPS6184062 | MANUFACTURE OF DETECTOR ASSEMBLY LIGHTED FROM BACK |
HIRAYAMA MAKOTO