METHOD OF DETECTING BURR IN DEFECT OF INNER LAYER CIRCUIT BOARD WITH METAL LAYER ETCHED AND REMOVED FROM MANY CIRCULAR DEFECTS

Title:

METHOD OF DETECTING BURR IN DEFECT OF INNER LAYER CIRCUIT BOARD WITH METAL LAYER ETCHED AND REMOVED FROM MANY CIRCULAR DEFECTS

Document Type and Number:

Japanese Patent JPS584998

Kind Code:

A

Inventors:

MURATA MIZUHO
NITSUTA NORIYUKI
WATANABE HIROSHI

Application Number:

JP10296681A

Publication Date:

January 12, 1983

Filing Date:

June 30, 1981

Export Citation:

Assignee:

HITACHI CHEMICAL CO LTD

International Classes:

H05K3/46; H05K3/00; (IPC1-7): H05K3/00

Domestic Patent References:

JP54050159B

Attorney, Agent or Firm:

Kunihiko Wakabayashi

Next Patent: AUTOMATIC PAPER SUPPLY METHOD IN PRINTER