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Title:
FLOW-RATE MEASURING METHOD BY USING SEMICONDUCTOR SENSOR
Document Type and Number:
Japanese Patent JPS6044827
Kind Code:
A
Abstract:

PURPOSE: To measure flow rates and average flow speed highly accurately, without disturbing the flow of a fluid to be measured, by arranging a semiconductor flow rate sensor and a temperature detecting sensor on the wall of a pipe.

CONSTITUTION: A base voltage V6 of a heating power transistor Q3 is controlled, and a collector current ic3 is adjusted. Then the temperature of a chip 51 is increased. At this time, since the temperature of a transistor Q1 becomes the same as that of a transistor Q2, emitter-base voltages VBE1 and VBE2 become the same, emitter currents iE1 and iE2 become the same, and ic1 and ic2 become the same. When there is no flow, the output becomes zero. When a fluid flows along a carrier plate, a temperature boundary layer is formed. The temperature difference yielded between Q1 and Q2 gives effect on the emitter-base voltages VBE1 and VBE2 of the temperature checking transistors Q1 and Q2. With the change in iE1 and iE2, difference occurs between ic1 and ic2, and finally difference occurs between V01 and V02.


Inventors:
TANAKA SUKEYOSHI
KIMIJIMA SUSUMU
Application Number:
JP15151883A
Publication Date:
March 11, 1985
Filing Date:
August 22, 1983
Export Citation:
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Assignee:
TOSHIBA KK
International Classes:
G01F1/68; G01F1/69; G01F1/698; (IPC1-7): G01F1/68
Attorney, Agent or Firm:
Noriyuki Noriyuki



 
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