Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
MICROWAVE THICKNESS MEASURING DEVICE
Document Type and Number:
Japanese Patent JPS59138909
Kind Code:
A
Abstract:

PURPOSE: To facilitate handling without having various restrictions and to obtain a stable thickness signal by using a microwave and processing two mutually 90° out-of-phase interference signals, and measuring the thickness of a sheet type running body.

CONSTITUTION: A sensor part 1A has a microwave Doppler sensor 2A, phase shifter 3A, transmitting/receiving antenna 4A, etc., and the antenna 4A is installed facing one surface of the sheet type body 20. The sensor 2A has a Gunn diode 5A, power source 6A, and crystal detector 7A, and transmits the microwave toward the antenna 4A and also detects 9 part of the transmit signal and a receive signal by the detector 7A. Sample holding circuits 11A and 12A sample and output the signal detected by the detector 7A. A switching circuit generator 13A generates a signal for driving a pin diode 9A, the circuits 11A and 12A, etc.


Inventors:
KIYOBE SEIICHIROU
Application Number:
JP1356283A
Publication Date:
August 09, 1984
Filing Date:
January 28, 1983
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
YOKOGAWA HOKUSHIN ELECTRIC
International Classes:
G01B15/02; (IPC1-7): G01B15/02
Attorney, Agent or Firm:
Shinsuke Ozawa



 
Previous Patent: JPS59138908

Next Patent: JPS59138910