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Patent Searching and Data


Title:
IN-CIRCUIT TESTING DEVICE
Document Type and Number:
Japanese Patent JPS5956176
Kind Code:
A
Abstract:

PURPOSE: To realize a labor-saving test, by press-contacting with a board which has wiring corresponding to a unit to be inspected between a probe for contacting a body to be measured and a signal leading-out post, in a generally used in- circuit test probe.

CONSTITUTION: A diaphragm plate 12 is arranged on a base 2 with a coil spring 13 between, and the plate 12 is fitted with airtight rubber 14 arranged freely slidably on a frame body 16. On the hand, sprint probes 4 are arranged in a base 3 at specific intervals and a personalizing board 5 which is moved up and down by a pressing-up instrument 17 is arranged on the reverse surface side of the base 3. A post 6 is implanted in the personalized board 5 to select a spring probe 4 which is used during a test according to the kind of the unit 1 to be tested. Consequently, a common jig used for many units to be checked which have different patterns is realized.


Inventors:
SASAKI TAMAKI
Application Number:
JP16631382A
Publication Date:
March 31, 1984
Filing Date:
September 24, 1982
Export Citation:
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Assignee:
TOKYO SHIBAURA ELECTRIC CO
International Classes:
G01R31/28; (IPC1-7): G01R31/28
Attorney, Agent or Firm:
Kiyoshi Inomata