Title:
TOMOGRAPHY AND TOMOGRAPH
Document Type and Number:
Japanese Patent JP3660185
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To provide a tomography and tomograph that can measure the thickness of affected parts easily and accurately by using short wave infrared light, or an invisible ray as a laser source of a confocal microscope.
SOLUTION: To measure refractivity and thickness of transparent objects using interference method of low coherence light and confocal method is fundamental. The new tomography is made not only by confocal method but by OCT method. The tomograms are made after calculating the actual thickness by using formulas of a relation among a distance of interfaces, refractivity, and thickness obtained by two tomography. The distance of interfaces by OCT method is obtained by multiplying refractivity by thickness, and the one by confocal method is obtained by thickness divided by refractivity. As a result, the actual thickness is found.
Inventors:
Masamitsu Haruna
Masato Omi
Masato Omi
Application Number:
JP2000028511A
Publication Date:
June 15, 2005
Filing Date:
February 07, 2000
Export Citation:
Assignee:
Japan Science and Technology Agency
International Classes:
A61B3/12; A61B3/10; A61B10/00; G01B11/22; G01N21/17; G01N21/41; (IPC1-7): A61B3/10; A61B3/12; A61B10/00; G01B11/22; G01N21/41
Domestic Patent References:
| JP11132949A | ||||
| JP10153550A | ||||
| JP9218016A | ||||
| JP6035946B2 |
Other References:
深野天、山口一郎,低コヒーレンス光源を用いた共焦点干渉顕微鏡による多層構造試料の解析,レーザー科学研究,日本,理化学研究所,1996年 9月30日,第18号,第122-124頁
Attorney, Agent or Firm:
Mamoru Shimizu
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