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Title:
基体の表面に対するトポグラフィ装置
Document Type and Number:
Japanese Patent JP2013500462
Kind Code:
A
Abstract:
A device for analyzing the topography of a surface (2) of a substrate (1) travelling on a substantially planar course with axes X, Y and Z defining an orthonormal frame of reference of the space. The surface (2) is substantially parallel to the plane XY. A device (10) for structured lighting of the surface (2) engages with a device (20) for measuring light backscattered by the surface (2) in order to analyze topography of the surface(2) during travel of the substrate (1). The lighting device (10) projecting a light beam (F) with an angle of incidence ‘a’ onto the surface (2), to form a plurality ‘n’ of luminous streaks (S1, S2, . . . Sn) thereon. Each luminous streak (S) forms an angle ‘b’ with the axis X1. The measurement device (20) includes a linear camera located in a plane P secant to the plane XY and the plane XZ, the intersection of the plane P with the plane XY forming angles.

Inventors:
Pirou Francis
Richard Mathieu
Rose Benoit
Application Number:
JP2012520938A
Publication Date:
January 07, 2013
Filing Date:
July 16, 2010
Export Citation:
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Assignee:
BOBST S.A.
International Classes:
G01B11/25; B31B50/88; G01N21/88
Domestic Patent References:
JPS61202128A1986-09-06
JP2003300260A2003-10-21
JP2006258438A2006-09-28
JP2009031150A2009-02-12
JP2000275186A2000-10-06
JP2009036589A2009-02-19
JPS5690205A1981-07-22
JP2006064590A2006-03-09
Attorney, Agent or Firm:
Koichi Tsujii
Sadao Kumakura
Disciple Maru Ken
Ino Sato
Mitsuru Matsushita
Ichiro Kurasawa
Hiroko Suzuki