Title:
Total-internal-reflection sample lighting installation
Document Type and Number:
Japanese Patent JP6062980
Kind Code:
B2
Abstract:
A total internal reflection sample illuminating device, which is capable of generating an evanescent wave easily only through inputting laser light without skill in the art, and which is easy to handle in performing fluorescence observation, non-invasive Raman imaging, or the like, includes: a device substrate (4), which is formed of a material having a refractive index at the same level as that of a slide glass (2) having a sample placed thereon, and which has a top surface on which the slide glass is placed; a light source holder (6) configured to allow laser light emitted by a laser light source (3) to enter the top surface of the device substrate (4) at a predetermined angle; an incident reflecting surface (7) configured to reflect the laser light that has entered the device substrate (4) such that the laser light enters the slide glass (2) and undergoes multiple total internal reflections in the slide glass (2); and an exit reflecting surface (8) configured to reflect the laser light that has entered the device substrate (4) from the slide glass (2) in a direction parallel to the top surface of the device substrate (4).
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Inventors:
Yohei Sato
Maho Urushidani
Shusuke Makino
Maho Urushidani
Shusuke Makino
Application Number:
JP2015038153A
Publication Date:
January 18, 2017
Filing Date:
February 27, 2015
Export Citation:
Assignee:
Keio University
Niigata Corporation
Niigata Corporation
International Classes:
G01N21/64
Domestic Patent References:
JP2008309785A | ||||
JP2006153643A | ||||
JP2012117837A |
Foreign References:
WO2007034796A1 | ||||
WO1994000761A1 | ||||
WO2009066515A1 | ||||
US5442169 |
Attorney, Agent or Firm:
Tetsuro Ide
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