Title:
全光束測定装置および全光束測定方法
Document Type and Number:
Japanese Patent JP5286571
Kind Code:
B2
Abstract:
In a total luminous flux measurement apparatus according to an embodiment, a total luminous flux emitted by an object is calculated based on a result of measuring illuminances using a measuring unit when providing relative movement between the object and an integrating unit to expose a substantially entire light emitting surface of the object to an inner space of the integrating unit. Specifically, under conditions that the object is disposed to penetrate the integrating unit from one sample hole to the other sample hole, a luminous flux of a portion of the object within the inner space of the integrating unit is measured, then the integrating unit is moved relative to the object, and a luminous flux of a portion accordingly contained in the inner space of the integrating unit is measured.
Inventors:
Kazuaki Okubo
Shunsuke Mishima
Shunsuke Mishima
Application Number:
JP2009124250A
Publication Date:
September 11, 2013
Filing Date:
May 22, 2009
Export Citation:
Assignee:
Otsuka Electronics Co., Ltd.
International Classes:
G01J1/02; G01J1/00
Domestic Patent References:
| JP2012503758A | ||||
| JP2002318156A | ||||
| JP2001281062A | ||||
| JP7146175A | ||||
| JP6167388A | ||||
| JP2253123A | ||||
| JP50126160U |
Attorney, Agent or Firm:
Kuro Fukami
Toshio Morita
Yoshihei Nakamura
Yutaka Horii
Masayuki Sakai
Nobuo Arakawa
Masato Sasaki
Toshio Morita
Yoshihei Nakamura
Yutaka Horii
Masayuki Sakai
Nobuo Arakawa
Masato Sasaki