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Patent Searching and Data


Title:
TRANSMISSION DELAY EVALUATION SYSTEM AND TRANSMISSION DELAY EVALUATION METHOD
Document Type and Number:
Japanese Patent JP2006208060
Kind Code:
A
Abstract:

To easily measure the transmission delay time for a signal transmitted from an arbitrary signal transmission point on a substrate, where an IC has been packaged to an arbitrary signal reception point on another substrate.

A transmission delay evaluation system measures the frequency characteristics of the transmission line between substrates, measures the first signal waveform in a time region observed from a signal transmission point and a second one in a time region of signals, reaching a signal reception point through the transmission line between substrates from the signal transmission point, performs convolution calculations on an impulse response obtained from the measured frequency characteristics and the first signal waveform, detects delay time on the transmission line between substrates based on the convolution operation result, detects delay time on the substrate, based on the convolution operation result and the second signal waveform, and adds the delay time on the transmission line between the substrates and that on the substrates.


Inventors:
SHIOIRI TOMOMI
FUKUCHI KIYOSHI
Application Number:
JP2005017594A
Publication Date:
August 10, 2006
Filing Date:
January 26, 2005
Export Citation:
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Assignee:
NEC CORP
International Classes:
G01R27/28
Attorney, Agent or Firm:
Rock wall Fuyuki
Makoto Shiokawa