To provide a tray handling mechanism of electronic parts supplied by trays, or an inspection device of the electronic parts using this mechanism, capable of reducing a replacing frequency of the trays, and capable of miniaturizing the device, in an inspection of continuous electronic parts.

A tray placing rack 2 for storing trays in multi steps is arranged, and the trays 5 for storing inspected electronic parts 9 are stored in the rack, and a tray stacking rack 4 is arranged in this upper part, and empty trays 5 emptied by having been inspected of electronic parts 9 before inspection at an inspection stage, are stacked on the tray stacking rack 4. When a certain tray 5 is discharged by being filled with the electronic parts 9 after inspection, the empty tray 5 is taken out of the tray stacking rack 4, and the empty tray 5 is supplied to the rack position of the tray 5, and the empty tray is used again (reused).