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Patent Searching and Data


Title:
ULTRASONIC FLAW DETECTING METHOD FOR THIN PLATE
Document Type and Number:
Japanese Patent JPH04256852
Kind Code:
A
Abstract:

PURPOSE: To make it possible to detect an inclusion about 100μm or more efficiently and economically.

CONSTITUTION: Ultrasonic linear-array probes 1 and W pair at the upstream and the downstream, has the point converting function at the test frequencies in 10-100MHz and has a plurality of piezoelectric transducers 11 and 21 in the direction perpendicular to the rolling direction. The adequate pairs of the probes 1 and 2 are arranged in the direction perpendicular to the rolling direction and/or the rolling direction. In the respective pair, the probe 1 on the upstream side performs electronic scanning continuously over the entier scanning range. When a defect is detected, the probe 2 forming the pair on the downstream side is made to scan by the predetermined number of times only in the small range including the detecting position.


Inventors:
FUJISAWA KAZUO
YAMANO MASAKI
Application Number:
JP3907191A
Publication Date:
September 11, 1992
Filing Date:
February 08, 1991
Export Citation:
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Assignee:
SUMITOMO METAL IND
International Classes:
G01N29/44; G01N29/22; G01N29/26; (IPC1-7): G01N29/22; G01N29/26
Attorney, Agent or Firm:
Mizogami Miyoshi (1 person outside)