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Title:
ULTRASONIC FLAW DETECTION SYSTEM AND ULTRASONIC FLAW DETECTION DEVICE
Document Type and Number:
Japanese Patent JP2013186087
Kind Code:
A
Abstract:

To provide an ultrasonic flaw detection system and an ultrasonic flaw detection device that can enhance accuracy of marking while simultaneously performing three-dimensional coordinate measurement and an ultrasonic flaw detection inspection, reducing inspection time and inspection costs and reducing marking time when a flaw of a structural object is found.

An ultrasonic flaw detection device comprises: determination means for determining whether or not a waveform of a reflection wave received by reception means is a predetermined waveform; marking means for marking a portion where the reflection wave occurs when determination results by the determination means indicate that the waveform is the predetermined waveform; and generation means for generating flaw detection data on the basis of the waveform of the reflection wave received. A laser tracker comprises: measurement means that projects a laser beam to reflection means and measures a distance to the reflection means and a direction in which the reflection means is positioned; and calculation means for calculating three-dimensional coordinates of a target on the basis of measurement results by the measurement means.


Inventors:
OGAWA TAKAHISA
SHIMONOSONO TSUTOMU
MARUYAMA KENSUKE
Application Number:
JP2012053657A
Publication Date:
September 19, 2013
Filing Date:
March 09, 2012
Export Citation:
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Assignee:
TOSHIBA CORP
International Classes:
G01N29/26; G01N29/04; G01N29/22
Attorney, Agent or Firm:
Kurata Masatoshi
Takakura Shigeo
Satoshi Kono
Makoto Nakamura
Yoshihiro Fukuhara
Takashi Mine
Toshio Shirane
Sadao Muramatsu
Nobuhisa Nogawa
Kocho Chojiro
Naoki Kono
Katsu Sunagawa
Morisezo Iseki
Takao Ako
Tadashi Inoue
Tatsushi Sato
Takashi Okada
Mihoko Horiuchi
Takenori Masanori