Title:
Understanding tendency measurement system
Document Type and Number:
Japanese Patent JP6170662
Kind Code:
B2
Inventors:
Atsushi Yoshikawa
Toshio Yamanashi
Toshio Yamanashi
Application Number:
JP2012232539A
Publication Date:
July 26, 2017
Filing Date:
October 22, 2012
Export Citation:
Assignee:
Edulab Co., Ltd.
International Classes:
G09B19/00; G06Q50/20; G09B7/02
Domestic Patent References:
| JP2012022185A | ||||
| JP2004139116A | ||||
| JP2004317713A | ||||
| JP2009003227A |
Foreign References:
| US20100047757 |
Attorney, Agent or Firm:
Patent business corporation Mutsuki Partners
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