Title:
UNEVEN LEVEL INSPECTION DEVICE, UNEVEN LEVEL INSPECTION METHOD, AND PROGRAM
Document Type and Number:
Japanese Patent JP2023050513
Kind Code:
A
Abstract:
To provide a technology that generates uneven level display data that enables uneven level inspection results to be intuitively and visually recognized.SOLUTION: An uneven level inspection device 1 comprises: a target T whose distance from an inspection plane is known; a travel unit 21 for traveling on the inspection plane; a communication unit 29 capable of communicating with a surveying instrument 6 that measures the three-dimensional position coordinates of the target T at a prescribed interval; and a control unit 10 for calculating the height of the inspection plane that corresponds to the measurement position of the target T, on the basis of the three-dimensional position coordinates of the target T. The control unit 10 calculates the height of the inspection plane that corresponds to the measurement position of the target T being measured each time the uneven level inspection device 1 travels a prescribed distance, on the basis of the three-dimensional position coordinates of the target T, and generates display data for displaying, on top of a site design drawing, uneven level information in which the difference between the height of the inspection plane and a reference height is associated with the position coordinates of inspection device.SELECTED DRAWING: Figure 1
Inventors:
KIKUCHI TAKESHI
Application Number:
JP2021160649A
Publication Date:
April 11, 2023
Filing Date:
September 30, 2021
Export Citation:
Assignee:
TOPCON CORP
International Classes:
G01C15/00; E04G21/02; E04G21/10; G01C5/00; G01C7/04; G06F3/0346
Attorney, Agent or Firm:
Yuki Kawano
Previous Patent: Irregularity level inspection device and Irregularity level inspection method
Next Patent: Vehicle and alarm device
Next Patent: Vehicle and alarm device