Title:
UNEVENNESS LEVEL INSPECTION DEVICE AND UNEVENNESS LEVEL INSPECTION METHOD
Document Type and Number:
Japanese Patent JP2023050512
Kind Code:
A
Abstract:
To provide a technique capable of printing unevenness-level information on an inspection surface in an intuitively and visually recognizable manner.SOLUTION: An unevenness level inspection device 1 is provided with a target T whose distance from an inspection surface is known, a traveling unit 21 for traveling on the inspection surface, a first marker 23 for marking information onto the inspection surface, and a control unit 10 for controlling the first marker 23. The control unit 10 calculates the height of the inspection surface at a measurement position of the target T based on three-dimensional position coordinates of the target T input every time the unevenness level inspection device 1 travels a predetermined distance, a first marker 23 is controlled so as to mark unevenness level information indicating the difference between the height of the inspection surface and the reference height at a corresponding position of the inspection surface, and the unevenness level information is marked in different colors according to the level of the magnitude of the difference between the height of the inspection surface and the reference height.SELECTED DRAWING: Figure 2
Inventors:
KIKUCHI TAKESHI
Application Number:
JP2021160648A
Publication Date:
April 11, 2023
Filing Date:
September 30, 2021
Export Citation:
Assignee:
TOPCON CORP
International Classes:
E04G21/10; B25H7/04; G01C5/00; G01C15/02
Attorney, Agent or Firm:
Yuki Kawano