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Title:
METHOD AND DEVICE FOR VISUAL INSPECTION OF ELECTRONIC COMPONENTS AND RECORDING MEDIUM WITH PROGRAM FOR ENABLING COMPUTER TO PERFORM VISUAL INSPECTION PROCESS RECORDED THEREIN
Document Type and Number:
Japanese Patent JP3107071
Kind Code:
B2
Abstract:

PROBLEM TO BE SOLVED: To provide a method and device for visual inspection of electronic components which can securely surely decide only a real defect, without being affected by unevenness, sealed characters, etc., included in a photographed image of the package of electronic components and the recording medium, where the program for enabling a computer to actualize the visual inspection processing is recorded.
SOLUTION: The device is equipped with an image pickup means 103, a means 106 which divides the photographed image into unit areas and finds distributions of the light and shade levels of the photographed image by unit areas, a means 107 which finds binarization levels of the respective unit areas by subtracting a previously set offset value from the light and shade level of the highest frequency in the distribution of the light and shade level of each unit area, a means 108 which finds binarization levels at respective coordinates of the photographed image through interpolating operation, based upon the binarization levels of the respective unit areas, and a binarizing means 107 which decides the presence of defects by comparing the binarization levels found with light and shade levels at the respective coordinates of the photographed image.


Inventors:
Masahiko Nagao
Application Number:
JP33817498A
Publication Date:
November 06, 2000
Filing Date:
November 27, 1998
Export Citation:
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Assignee:
NEC
International Classes:
G01N21/88; G06T1/00; G01B11/24; G06T7/00; G06T7/60; G06V30/162; G01R31/311; G06V30/10; H01L23/544; (IPC1-7): G01B11/24; G01N21/88; G06T7/00
Domestic Patent References:
JP5280959A
JP9304292A
JP4157353A
JP61201105A
Attorney, Agent or Firm:
Naoki Kyomoto (2 outside)



 
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