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Title:
VIBRATION TESTING APPARATUS FOR STRUCTURE AND ITS VIBRATION TESTING METHOD
Document Type and Number:
Japanese Patent JP3882014
Kind Code:
B
Abstract:

PROBLEM TO BE SOLVED: To provide a vibration testing apparatus for a structure which performs a vibration test with high precision even for a large-scale, complex, and nonlinear numerical model section when performing a vibration test with combining a vibration test with vibration response numerical analysis for only a part of the structure.
SOLUTION: The vibration testing apparatus for a structure comprises vibrating means 4 for vibrating a real object model 2, load measuring means 6 for measuring a load, and a computer 5 to which the numerically modeled numerical model section 3 is inputted. The computer 5 comprises means 13 for calculating displacement after a lapse of predetermined time from the time of measurement on the basis of a load value and an external force value, means 14 for creating a command signal with the displacement set as a target figure, and step control means 15 for controlling so that the processes by these means are periodically performed. The command displacement calculation means 13 uses the αOS method for the temporal integration for a vibration equation. The balancing equation in each temporal step is based on an increment from the previous temporal step.


Inventors:
Fukuyama, Mayumi
Konno, Takao
Umekita, Kazuhiro
Dosono, Birei
Horiuchi, Toshihiko
Sakai, Michiya
Hagiwara, Yutaka
Otomo, Keizo
Application Number:
JP2004000010047
Publication Date:
November 24, 2006
Filing Date:
January 19, 2004
Export Citation:
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Assignee:
HITACHI INDUSTRIES CO LTD
CENTRAL RES INST OF ELECTRIC POWER IND
International Classes:
G01M7/02; G01N29/00; G01N29/04; G01N29/44; G01M7/00; G01N29/00; G01N29/04; G01N29/44; (IPC1-7): G01M7/02