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Title:
VISION SHIFT AMOUNT MEASURING METHOD AND VISION SHIFT AMOUNT MEASURING JIG
Document Type and Number:
Japanese Patent JP2011138064
Kind Code:
A
Abstract:

To provide a vision shift amount measuring method and jig, capable of measuring a vision shift amount easily and accurately at low cost.

After a distance eye point reference point and a frame supporting member for the measuring jig are positioned, the outer surfaces of a pair of dummy lenses 10 are pressed against the low-repulsive materials of a pair of lens carrying units. Thereby, ink is charged to a group of projection bars, and a reference mark 31, first determination mark 32, and second determination mark 33 are formed on the surface of each of the dummy lenses 10 (mark forming step). Then, a person actually wears the spectacles 100 that have dummy lenses 10 with the marks thereon, and which position of the first determination mark 32 the pupil center (vision) of the wearer (near view) passes through when the wearer is reading (determining step).


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Inventors:
WADA OSAMU
Application Number:
JP2009299058A
Publication Date:
July 14, 2011
Filing Date:
December 29, 2009
Export Citation:
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Assignee:
SEIKO EPSON CORP
International Classes:
G02C13/00; G02C7/00; G02C7/02
Domestic Patent References:
JPH0389416U1991-09-12
JP2004045873A2004-02-12
JP2004347947A2004-12-09
JP2006091411A2006-04-06
Foreign References:
US20070222938A12007-09-27
US5754272A1998-05-19
US8115792B22012-02-14
Attorney, Agent or Firm:
Masahiko Ueyanagi
Osamu Suzawa
Kazuhiko Miyasaka



 
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