Title:
VISUAL INSPECTION METHOD
Document Type and Number:
Japanese Patent JP2021173530
Kind Code:
A
Abstract:
To provide a visual inspection method capable of easily detecting an edge defect even for an inspection object having a complicated contour shape by a method different from the conventional method.SOLUTION: A visual inspection method includes: a data acquisition step to obtain image data including the contour of a surface to be inspected by imaging an inspection object; a contour line extraction step of performing edge detection processing on the image data to extract a contour line of the surface to be inspected; a slope acquisition step for obtaining a slope of the virtual tangent for each pixel of interest on the contour line, using two pixel data of a front pixel and a rear pixel separated by a predetermined number of pixels in both front and rear directions from the pixel of interest on the contour line; a scattering degree acquisition step for obtaining a scattering degree of the slope; and a determination step for determining the presence or absence of edge defects from the scattering degree.SELECTED DRAWING: Figure 1
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Inventors:
NAKASE AKIYOSHI
YAMADA KAZUAKI
YUKAWA MASAKI
TERADA KENJI
YAMADA KAZUAKI
YUKAWA MASAKI
TERADA KENJI
Application Number:
JP2020074426A
Publication Date:
November 01, 2021
Filing Date:
April 17, 2020
Export Citation:
Assignee:
JTEKT CORP
UNIV TOKUSHIMA
UNIV TOKUSHIMA
International Classes:
G06T7/00; G01N21/88; G06T7/64
Attorney, Agent or Firm:
Patent Business Corporation Aichi International Patent Office
Patent business corporation Kyoritsu
Patent business corporation Kyoritsu
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