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Patent Searching and Data


Title:
WAFER SEPARATING DEVICE AND ITS METHOD
Document Type and Number:
Japanese Patent JP2000164534
Kind Code:
A
Abstract:

To provide a wafer separating device and its method, capable of preventing contamination of a semiconductor device and damages of a semiconductor package.

A wafer separating method includes the steps of forming a trench 218 in a semiconductor wafer along a scribing line, placing a semiconductor wafer on a stage 310 and aligning each semiconductor device 215 to a corresponding hole fixing the semiconductor wafer to the stage 310 through the use of a vacuum, and applying mechanical force to the semiconductor wafer to cut the semiconductor wafer along the scribing line. A wafer-separating device has a top surface for mounting a wafer on a soft structure and having plural holes evacuated to a vacuum to fix the wafer, the soft structure having at least one hole aligned to the bottom of each semiconductor 215 formed on the wafer, and a pressing means for pressing and cutting the wafer along a trench 218 between the semiconductor devices.


Inventors:
JIN HO TAE
HONG IN PYO
KIN HEIBAN
HO SEIKO
Application Number:
JP32592999A
Publication Date:
June 16, 2000
Filing Date:
November 16, 1999
Export Citation:
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Assignee:
SAMSUNG ELECTRONICS CO LTD
International Classes:
H01L21/00; H01L21/301; H01L21/78; (IPC1-7): H01L21/301
Attorney, Agent or Firm:
Hattori Masaki