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Patent Searching and Data


Title:
WALL THICKNESS MEASURING DEVICE AND WALL THICKNESS MEASURING METHOD
Document Type and Number:
Japanese Patent JP2013195126
Kind Code:
A
Abstract:

To provide a wall thickness measuring device and a wall thickness measuring method which can easily perform measurement with high accuracy.

A wall thickness measuring device comprises: a non-contact distance meter 10 measuring a distance to a measurement object ic; and a fixture 20 fixing the non-contact distance meter 10 to the measurement object ic. The fixture 20 includes a fixed pedestal 21 fixed to the measurement object ic, and a variable part for holding the non-contact distance meter 10 in such a manner that a pitch angle and/or yaw angle are changeable. The distance to the measurement object ic is measured by the non-contact distance meter 10, so that a wall thickness of the measurement object ic can be calculated by using the distance obtained by the measurement. Therefore, the measurement of the wall thickness can be easily performed with high accuracy.


Inventors:
GOTO YUKO
SASAI SHIGERU
Application Number:
JP2012060275A
Publication Date:
September 30, 2013
Filing Date:
March 16, 2012
Export Citation:
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Assignee:
SUMITOMO METAL MINING CO
International Classes:
G01B11/06; F27D21/00; G01B21/08
Attorney, Agent or Firm:
Yasunobu Yamauchi
Hiroshi Nakai
Shin Yamauchi