Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
WAVE FRONT MEASURING INTERFEROMETER UNIT, AND LIGHT BEAM MEASURING INSTRUMENT AND METHOD
Document Type and Number:
Japanese Patent JP2006023279
Kind Code:
A
Abstract:

To provide a wave front measuring interferometer unit provided with a compact optical system of simple constitution, and capable of regulating easily the optical system, and a light beam measuring instrument and method capable of measuring a wave front of a light beam and measuring a characteristic of a light beam spot.

This light beam measuring instrument 10A is provided with a beam splitter 13 for splitting the light beam emitted from a light source part 11 into two beams, a semi-transparent reflection face 15a for reflecting one portion of the separated one light beam as a inspected light beam to a direction reverse to an incident direction, and a reflection type reference light generating means 23 for converting one portion of the transmitted light beam transmitted through the semi-transparent reflection face 15a into a wave front-faired reference light beam to be output. The wave front of the light beam, and the characteristic of the light beam spot are measured by such a manner.


Inventors:
Katsura, Souto
Saito, Takayuki
Kurose, Minoru
Application Number:
JP2005000128344
Publication Date:
January 26, 2006
Filing Date:
April 26, 2005
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
FUJINON CORP
International Classes:
G01J5/00; G01B9/02; G01B11/24