WAVEFORM DATA ANALYSIS APPARATUS AND SYSTEM

Japanese Patent JP3723107

B2

PROBLEM TO BE SOLVED: To easily analyze and identify factors for causing echoes (echo generation sources) in a target to be inspected.
SOLUTION: A plurality of test pieces where an echo generation source is specified in advance under a plurality of sampling conditions are inspected, echo waveform data are obtained, and the sampling conditions and the waveform data are stored in a database 11 as inspection information while they correspond each other. A sampling condition search processing section 15 searches for the database when sampling conditions are specified as a specified sampling conditions to obtain a search result for specifying the inspection information corresponding to the specified sampling conditions. A waveform search processing section 14 searches for echo waveform data from the database based on the search result. Then, a waveform display processing section 13 displays the waveform of the search result on a screen. The echo waveform data are displayed on a screen by an A scope that is prescribed by a distance direction and echo height in the case of an ultrasonic flaw detection test, and at the same time are displayed on a screen by a B scope that is prescribed by a distance direction and a scanning direction. Additionally, the waveform search processing section searches for echo waveform data that are similar to specific echo waveform data.

Naoto Kawase
Wakayama Seiichi
Seki Isao

JP2001278035A

December 07, 2005

September 13, 2001

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MITSUBISHI HEAVY INDUSTRIES,LTD.

G01N29/44; G01N29/22; (IPC1-7): G01N29/22

JP9080034A
JP8105977A
JP10123107A
JP10179586A

Masahisa Takahashi
Hisamaru Hanada

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