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Title:
WAVEFORM DATA REPRODUCING DEVICE, WAVEFORM DATA REPRODUCING METHOD, PROGRAM PRODUCT, AND WAVEFORM DATA REPRODUCING SYSTEM
Document Type and Number:
Japanese Patent JP3835386
Kind Code:
B2
Abstract:

PROBLEM TO BE SOLVED: To retrieve waveform data of an object for the object of inspection, from stored past record data accompanying abnormal sound inspection or the like, and to easily reproduce the waveform data such as the sound of the object to be inspected.
SOLUTION: The waveform data reproducing system includes a past record data file 3 outputted from a waveform analysis inspection device 1, a database storage part 12, an inspection result retrieving 13, and a waveform data sound reproducing part 14. The database storage part 12 acquires a waveform data file 4, which is the base in obtaining the past record data of the past record data file 3 and correlates and stores them in an inspection result database 11. The inspection result retrieval part 13 accesses the inspection result database stored in the database storage part 12 to extract the past record data, which match a prescribed retrieval conditions, and outputs retrieval result information, based on the extracted past record data. The waveform data sound reproducing part 14 reads out the waveform data corresponding to the retrieval result which is designated according to the retrieval result information by the inspection result retrieval part 13, and reproduces the waveform data read out.


Inventors:
Masanori Ota
Atsushi Irie
Furuhisa Katsuhisa
Application Number:
JP2002278775A
Publication Date:
October 18, 2006
Filing Date:
September 25, 2002
Export Citation:
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Assignee:
OMRON Corporation
International Classes:
G01D9/00; G01H3/00; G01H17/00; G01M99/00; (IPC1-7): G01M19/00; G01D9/00; G01H3/00
Domestic Patent References:
JP2002257625A
JP2001142903A
JP11316765A
JP2001091414A
Attorney, Agent or Firm:
Shinichi Matsui