Title:
波形表示方法及び試験測定機器
Document Type and Number:
Japanese Patent JP5273715
Kind Code:
B2
Abstract:
A method of region overlap control for the display of a plurality of waveforms on an instrument includes an overlap function that allows selection by a user of a vertical height on a display screen for each of the waveforms. A ground marker for each of the waveforms is adjusted on the display screen according to the selected vertical height. The result is that the plurality of waveforms are displayed on the display screen in an overlapping fashion with sufficient vertical height to enhance triggering, all measurement functions and secondary functions, such as harmonics and switching loss measurements.
Inventors:
Craig Et Nelson
David Shanks
Ivan A. Deckkinson
Raf x running
Stephen Sea Herring
David Shanks
Ivan A. Deckkinson
Raf x running
Stephen Sea Herring
Application Number:
JP2008265652A
Publication Date:
August 28, 2013
Filing Date:
October 14, 2008
Export Citation:
Assignee:
TEKTRONIX,INC.
International Classes:
G01R13/20; G01R13/30
Domestic Patent References:
| JP2000035447A | ||||
| JP8105916A |
Attorney, Agent or Firm:
Yamaguchi International Patent Office
Kunio Yamaguchi
Takashi Yamaguchi
Kunio Yamaguchi
Takashi Yamaguchi