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Patent Searching and Data


Title:
WAVEFORM MEASURING APPARATUS
Document Type and Number:
Japanese Patent JP2003337143
Kind Code:
A
Abstract:

To provide a waveform measuring apparatus for performing a discrimination processing operation in a short time.

The waveform measuring apparatus is provided with a measuring part 2 used to measure a voltage of an input signal S1 at a prescribed sampling cycle so as to output measured-value information D1; a storage memory 8 used to store the output measured-value information D1; a RAM 9 used to store a reference value corresponding to each measured-value information D1; and a control part 5 used to decide whether each measured value stored in the storage memory 8 or a mean value of a plurality of measured values to be output continuously in a time-series manner satisfies a set condition or not with respect to the reference value stored in the RAM 9.


Inventors:
YAMAMOTO KOICHI
Application Number:
JP2002142891A
Publication Date:
November 28, 2003
Filing Date:
May 17, 2002
Export Citation:
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Assignee:
HIOKI ELECTRIC WORKS
International Classes:
G01R13/20; (IPC1-7): G01R13/20
Attorney, Agent or Firm:
Shinji Sakai